@xrayxiaoruiyang-pixel

afm-force-curve-analyzer-1-0-0 extracts mechanical properties from atomic force microscopy indentation data across multiple material models, supporting electrochemical correlation and force mapping with reference material database.

afm-secm-correlation-tools-1-0-0 correlates atomic force microscopy topography with scanning electrochemical microscopy activity maps to identify structure-activity relationships in electrocatalysis, including spatial overlay, grain segmentation, hotspot detection, and statistical correlation.

afm-image-analysis-1-0-0 computes surface roughness metrics, detects nanoparticles via otsu thresholding, extracts line profiles, renders 3d surfaces, and processes batches with csv and json output. supports multiple input formats including numpy arrays and image files.

Track and manage electrochemistry samples from synthesis to characterization with data linking, event logging, search, export, and dashboard visualization.